Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysis
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United States of America Patent
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Apr 10, 2012
Grant Date -
Oct 28, 2010
app pub date -
Apr 23, 2010
filing date -
Apr 23, 2009
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Abstract
A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic Lα and Lβ x-rays of lead provides an indication of whether the lead is located primarily in a coating (e.g., paint) layer on the object, or in a thin or thick bulk material. If the intensity ratio indicates that the lead is located in a coating layer or distributed in a thin bulk material, an areal density of lead is determined from at least one of the characteristic x-ray intensities, and the measured areal density is compared to specified lower and upper limits to determine whether the object is unambiguously compliant, unambiguously non-compliant, or indeterminate.
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