Appearance inspection device

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United States of America Patent

PATENT NO 8154593
APP PUB NO 20100188501A1
SERIAL NO

12602351

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An appearance inspection device, which inspects an appearance of test objects, includes a first and second conveying means 21 and 22a conveying the test objects, a back/front reversal means 23 turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a, and a plurality of image-pickup means 30b and 30c capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a. The appearance inspection device also includes a defect detection means detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect an entire appearance of the test objects.

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Patent Owner(s)

Patent OwnerAddress
QUALICAPS CO LTD321-5 IKEZAWA-CHO YAMATOKORIYAMA-SHI NARA 6391032 ?6391032

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishida, Tetsuhisa Yamatokoriyama, JP 8 45
Kasai, Kenichi Yamatokoriyama, JP 37 1124
Nagao, Akira Yamatokoriyama, JP 19 136
Sato, Ken Yamatokoriyama, JP 116 1112
Yagyu, Motohiro Yamatokoriyama, JP 13 148
Yasui, Junsuke Yamatokoriyama, JP 5 17

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