THz investigation apparatus and method
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United States of America Patent
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Mar 20, 2012
Grant Date -
Aug 13, 2009
app pub date -
May 18, 2007
filing date -
May 19, 2006
priority date (Note) -
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Abstract
Apparatus for measurement of a sample comprises means for generating electromagnetic radiation comprising a photoconductive device, the generating means is arranged to generate an output signal comprising electromagnetic radiation in dependence upon radiation received by the photoconductive device and to transmit the output signal towards a sample space, the apparatus further comprises a first radiation source and a second radiation source, arranged such that the radiation received by the photoconductive device comprises a mixture of radiation from the first radiation source and radiation from the second radiation source, control means for varying the frequency of the electromagnetic radiation of the output signal by varying the temperature of the first radiation source and/or the temperature of the second radiation source, and detecting means for detecting a response signal.
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