Apparatus and method for the detection of forces in the sub-micronewton range
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United States of America Patent
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Mar 6, 2012
Grant Date -
Jan 14, 2010
app pub date -
Jul 2, 2009
filing date -
Jan 5, 2007
priority date (Note) -
Expired
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Abstract
A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
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