Microporous tectosilicate and method for the production thereof

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United States of America Patent

PATENT NO 8124560
APP PUB NO 20110135567A1
SERIAL NO

12899572

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Abstract

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The present invention relates to a tectosilicate having an X-ray diffraction pattern in which at least the following reflections occur:

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Patent Owner(s)

Patent OwnerAddress
BASF AKTIENGESELLSCHAFT67056 LUDWIGSHAFEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brown, James Reuben Mannheim, DE 5 28
Gies, Hermann Sprockhoevel, DE 32 139
Lippert, Gerald Lampertheim, DE 8 101
Marler, Bernd Gevelsberg, DE 16 34
Mueller, Ulrich Neustadt, DE 289 1865
Stroeter, Nadine Bochum, DE 1 0
Wang, Yingxia Beijing, CN 2 9

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