Abnormal event detection using principal component analysis
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United States of America Patent
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Feb 21, 2012
Grant Date -
Feb 11, 2010
app pub date -
Oct 16, 2007
filing date -
Oct 18, 2006
priority date (Note) -
Expired
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Abstract
Process control system for detecting abnormal events in a process having one or more independent variables and one or more dependent variables. The system includes a device for measuring values of the one or more independent and dependent variables, a process controller having a predictive model for calculating predicted values of the one or more dependent variables from the measured values of the one or more independent variables, a calculator for calculating residual values for the one or more dependent variables from the difference between the predicted and measured values of the one or more dependent variables, and an analyzer for performing a principal component analysis on the residual values. The process controller is a multivariable predictive control means and the principal component analysis results in the output of one or more scores values, T2 values and Q values.
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