Semiconductor substrate fabrication by etching of a peeling layer

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8119499
APP PUB NO 20080299746A1
SERIAL NO

12064584

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Abstract

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A semiconductor substrate fabrication method according to the first aspect of this invention is characterized by including a preparation step of preparing an underlying substrate, a stacking step of stacking, on the underlying substrate, at least two multilayered films each including a peeling layer and a semiconductor layer, and a separation step of separating the semiconductor layer.

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Patent Owner(s)

Patent OwnerAddress
FURUKAWA CO LTD6-4 OTEMACHI 2-CHOME CHIYODA-KU TOKYO 1008370 ?1008370
MITSUBISHI CHEMICAL CORPORATIONTOKYO
EPIVALLEY CO LTD321 GONGDAN-DONG GUMI-CITY GYUNGSANGBUK-DO 730-030 SOUTH KOREA
DOWA HOLDINGS CO LTD4-14-1 SOTOKANDA CHIYODA-KU TOKYO 101-0021
WAVESQUARE INC633-2 GOAN-RI BAEKAM-MYEON CHEOIN-GU YONGIN-CITY GYEONGGI-DO 449-863

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cho, Meoung-Whan Miyagi-ken, JP 14 289
Yao, Takafumi Miyagi-ken, JP 17 368

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