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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES	CHIBA COUNTY JAPAN

International Classification(s)

• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Shirakawa, Yoshiyuki	Chiba, JP	8	61

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
January 31, 2012	US,8106362,B2   US8106362B2	GRANTED PATENT AS SECOND PUBLICATION
December 03, 2009	US,20090294669,A1   US20090294669A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8106362

Surface contamination examining device and method

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