Goniometer
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United States of America Patent
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Jan 24, 2012
Grant Date -
Feb 25, 2010
app pub date -
Apr 3, 2007
filing date -
Apr 3, 2007
priority date (Note) -
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Abstract
The invention relates to a goniometer and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises a base (1), and a measurement head (12) including both an X-ray tube and a detector arc (11) movably adapted to the base (1) by a robot capable for three-dimensional movement. In accordance with the invention the robot has means for creating arc-formed movement of the measurement head (12) during the measurement with rotating (5, 7, 15) and tilting (3, 16, 9) joints.
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