Scanning probe microscope with automatic probe replacement function
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 17, 2012
Grant Date -
Feb 11, 2010
app pub date -
Sep 29, 2009
filing date -
Dec 21, 2006
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An automatic probe exchange system for a scanning probe microscope (SPM) exchanges probes between a probe mount on the SPM and a probe mount on a probe tray based on differential magnetic force. When the magnetic force on the SPM side is greater, the probe is attached to the probe mount on the SPM. When the magnetic force on the probe tray side is greater, the probe is attached to the probe mount on the probe tray. The magnetic force on the probe tray side is varied by moving the magnets that generate the magnetic force on the probe tray side closer to or further from the probe.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully