Atomic force microscopy probe
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United States of America Patent
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Jan 3, 2012
Grant Date -
Aug 12, 2010
app pub date -
Apr 23, 2008
filing date -
May 2, 2007
priority date (Note) -
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Abstract
A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in that: it also includes means (EL1) for selectively exciting a volume mode of oscillation of said resonator (RMM); and in that said tip for atomic force microscopy (P1, P1') projects from said resonator substantially in correspondence with an antinode point (PV1) of said volume mode of oscillation. An atomic force microscope including such a probe (SM'). A method of atomic force microscopy including the use of such a probe.
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