Socket for inspection
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United States of America Patent
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Dec 13, 2011
Grant Date -
Sep 17, 2009
app pub date -
Jul 27, 2007
filing date -
Jul 27, 2006
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A support block is provided with a plurality of through holes for supporting probes. The probes for signals, for power supply and for grounding are secured in the through holes of the support block and electrically interconnect electrode terminals of a device to be inspected, which is provided on one face side of the support block, and wiring terminals connected to an inspection unit, which is provided on the other face side of the support block. A device guide is integrally formed with or separately fixed to the one face side of the support block, and includes an opening having a square shape in a plan view for guiding the device to be inspected. A centering mechanism adjusts a position of the device to be inspected at a center position of the opening of the device guide.
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