Stamps with micrometer- and nanometer-scale features and methods of fabrication thereof
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United States of America Patent
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Dec 6, 2011
Grant Date -
Nov 25, 2010
app pub date -
Dec 19, 2005
filing date -
Dec 20, 2004
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Abstract
Stamps and methods of making stamps for applications in anti-counterfeiting and authentication. The stamps are relatively small in size and feature nanoscale and microscale identification regions and features. High throughput manufacturing and high resolution methods are used to make the stamps including electron beam lithography and optical lithography. Anti-fouling coatings can be applied.
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