Multi-source sensor for three-dimensional imaging using phased structured light
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United States of America Patent
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Nov 22, 2011
Grant Date -
Jul 30, 2009
app pub date -
Jan 23, 2009
filing date -
Jan 25, 2008
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Abstract
A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point of view, the second point of view differing from the first point of view. An area array image detector simultaneously acquires at least first and second fringe images relative to the first and second patterned illuminations. A controller is coupled to the first and second sources and to the detector. The controller generates a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.
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