High-resolution ion chamber

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United States of America Patent

PATENT NO 8044365
APP PUB NO 20100038528A1
SERIAL NO

12542850

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Nested ionization chambers provide independent measurements of a radiation beam that does not fully irradiate the volume of one or both chambers. By mathematically combining these independent measurements, partial volume effects caused by a change in ionization detector calibrations when the full detector volume is not irradiated by the radiation beam, may be decreased, providing more accurate measurement of extremely small radiation beams.

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Patent Owner(s)

Patent OwnerAddress
STANDARD IMAGING INC7602 MURPHY DRIVE MIDDLETON WI 53462

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
DeWerd, Larry A Madison, US 2 12
Hooten, Brian D Middleton, US 1 1
Neumueller, Edward W Verona, US 1 1

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