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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
IN-DEPTH TEST LLC	2400 DALLAS PARKWAY SUITE 200 PLANO TX 75093

International Classification(s)

• G06F:ELECTRIC DIGITAL DATA PROCESSING

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Buxton, Paul M	West Lothian, GB	2	61
Martin, Emilio Miguelanez	Edinburgh, GB	2	61
Tabor, Eric Paul	Gilbert, US	10	273
Zalzala, Ali M S	Edinburgh, GB	2	53

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
October 18, 2011	US,8041541,B2   US8041541B2	GRANTED PATENT AS SECOND PUBLICATION
January 24, 2008	US,20080021677,A1   US20080021677A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8041541

Methods and apparatus for data analysis

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