Test equipment for verification of crystal linearity at high-flux levels
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United States of America Patent
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Oct 18, 2011
Grant Date -
Oct 13, 2011
app pub date -
Apr 13, 2010
filing date -
Apr 13, 2010
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Abstract
A method and device that provides independent temperature control of x-ray detector crystals, either singly or in small groups. In addition to a thermal control network for the crystals, electronic devices are associated with each detector crystal and are independently cooled using Peltier devices so that lifetime and reliability are maximized. In most operating environments the ambient temperature is less than the operating temperature of the detector crystals. In these situations, the heat removed from the electronics can be used to heat the detector crystals, resulting in efficient operation.
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