System and method for intelligently analyzing performance of a device under test
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 23, 2011
Grant Date -
N/A
app pub date -
Nov 1, 2006
filing date -
Nov 1, 2006
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and apparatus is provided that enables accurate measurement of drop rate and delay in a System Under Test (SUT) by one or more monitoring devices even when the frame error rate of the monitoring devices may be imperfect. During a packet drop measurement process, ancillary information is identified and analyzed to determine if the ancillary information can be used to infer receipt of packets when explicit information regarding receipt is not present. A delay measurement process incorporates the time required to re-transmit packets into the delay measurement to more accurately reflect SUT operation.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully