Semiconductor nanoparticle fluorescent reagent and fluorescence determination method

United States of America Patent

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Aug 23, 2011
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Aug 10, 2006
app pub date
Mar 27, 2006
filing date
Mar 27, 2002

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Expired

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Abstract

The present invention measures defect fluorescence exhibited from a defect level mainly on a semiconductor nanoparticle surface site which has an energy level existing inside the forbidden band of energy levels inside the semiconductor nanoparticle.

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HITACHI SOFTWARE ENGINEERING CO LTD	YOKOHAMA-SHI KANAGAWA 230-0045

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Inventor Name	Address	# of filed Patents	Total Citations
Kuwabata, Susumu	Osaka, JP	57	473
Sato, Keiichi	Tokyo, JP	177	2046

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Semiconductor nanoparticle fluorescent reagent and fluorescence determination method

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United States of America Patent

11389151

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PATENT NO	8003409
APP PUB NO	20060174821A1
SERIAL NO	11389151
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
August 23, 2011	US,8003409,B2 US8003409B2	GRANTED PATENT AS SECOND PUBLICATION
August 10, 2006	US,20060174821,A1 US20060174821A1	FIRST PUBLISHED PATENT APPLICATION

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11389151

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