Gas analyzing method and gas analyzing apparatus

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United States of America Patent

PATENT NO 7989761
APP PUB NO 20090173879A1
SERIAL NO

12347377

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained through soft ionization process from a second gas having same concentration of components as that of the first gas are subjected to mass analysis to obtain ion intensities which stored in a second file, and molecular weights are determined based on parent ions from soft ionization measurement data. A mass spectrum corresponding to the determined molecular weight is read out based on an NIST database, and the ion intensity data stored in the first file and the read out NIST data are compared with each other, and component molecules of the first gas are determined based on the comparison results. Qualitative analysis of mixed gas can be conducted in real time with high accuracy by making effective use of the measurement data of both mass analysis based on EI process and mass analysis based on soft ionization process.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 196-8666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arii, Tadashi Fussa, JP 9 44
Matsumoto, Kyoji Koganei, JP 1 3
Otake, Satoshi Tachikawa, JP 38 379

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