Conduction-cooled accelerated test fixture
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United States of America Patent
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Jul 19, 2011
Grant Date -
May 28, 2009
app pub date -
Jan 29, 2009
filing date -
Apr 5, 2006
priority date (Note) -
Expired
status (Latency Note)
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Abstract
According to one embodiment of the invention, a testing apparatus for executing highly accelerated life testing on at least one test subject includes at least one structure operable to thermally stress the test subject via conduction and at least one pneumatic hammer operable to input imparting vibrations to the test subject. According to another embodiment of the invention, a method for executing highly accelerated life testing of at least one test subject includes applying a thermal stress to the test subject via conduction at a rate of change of at least 8° C. per minute and imparting vibrations to the test subject at a rate of at least 3 Gs rms.
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