Semiconductor device manufacturing method

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United States of America Patent

PATENT NO 7981787
APP PUB NO 20100048016A1
SERIAL NO

12461577

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Abstract

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A semiconductor device manufacturing method includes: providing a laminated member in which at least a first GaAs layer, an InAlGaAs layer and a second GaAs layer are laminated on or above a substrate in this order; and etching the second GaAs layer using the InAlGaAs layer as an etching stopper layer. A ratio of In:Al of the InAlGaAs layer is in a range of approximately 4:6 to approximately 6:4 and a ratio of (In+Al):Ga of the InAlGaAs layer is in a range of approximately 1.5:8.5 to approximately 5:5.

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Patent Owner(s)

Patent OwnerAddress
NEOPHOTONICS CORPORATION3081 ZANKER ROAD SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Izumi, Takayuki Tokyo, JP 19 122
Ohshima, Tomoyuki Tokyo, JP 4 13
Shigemasa, Ryoji Tokyo, JP 2 7

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