Infrared imaging using thermal radiation from a scanning probe tip
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United States of America Patent
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Jul 12, 2011
Grant Date -
Feb 25, 2010
app pub date -
Aug 12, 2008
filing date -
Aug 12, 2008
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Abstract
A method for performing sub-micron optical spectroscopy, using a heated SPM probe and far-field collection optics is described. The enhanced emission characteristics at a sharp heated tip constitute a highly localized wideband IR source. Thus the IR absorption and emission properties of a sample surface adjacent can be observed and measured in the farfield even though the interaction region is sub-micron in scale. . . . providing spatial resolution mapping of sample composition.
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