Systems and methods for test time outlier detection and correction in integrated circuit testing
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United States of America Patent
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Jun 28, 2011
Grant Date -
Jul 30, 2009
app pub date -
Apr 3, 2009
filing date -
Jul 6, 2005
priority date (Note) -
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Abstract
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
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