Control apparatus and method for controlling measuring devices to test electronic apparatuses

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United States of America Patent

PATENT NO 7949899
APP PUB NO 20090049352A1
SERIAL NO

12174635

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An electronic apparatus testing method is provided. The method includes the step of: reading a product ID of the electronic apparatus when the electronic apparatus is connected to a control apparatus; determining the device type ID from the product ID, wherein the product ID comprises basic information of the electronic apparatus, determining the script files of the functions of the electronic apparatus in the testing table according to the device type ID; obtaining the script files from a data storage and running the script files to test functions of the electronic apparatuses, sending a control instruction to the corresponding measuring device of the function to control the measuring device test the function during the process of running the script files; and displaying test results through a display of the control apparatus.

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Patent Owner(s)

Patent OwnerAddress
HON HAI PRECISION INDUSTRY CO LTD66 CHUNG SHAN ROAD TU-CHENG DIST NEW TAIPEI
HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO LTDNO 2 2ND DONGHUAN ROAD LONGHUA TOWN BAO' AN DISTRICT SHENZHEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Peng Shenzhen, CN 449 2483
Cheng, Hua-Dong Shenzhen, CN 113 660
Hsieh, Kuan-Hong Taipei Hsien, TW 467 4772
Lian, Wen-Chuan Taipei Hsien, TW 56 523
Wang, Han-Che Taipei Hsien, TW 210 1256
Zhao, Yao Shenzhen, CN 76 811

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