Multiple optical input inspection system
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United States of America Patent
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Apr 12, 2011
Grant Date -
Nov 15, 2007
app pub date -
May 15, 2007
filing date -
Feb 13, 2001
priority date (Note) -
Expired
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Abstract
A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other image so as to produce an enhanced representation of the electrical circuit, and inspecting the enhanced representation for defects.
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