Spectroscopic determination of enantiomeric purity

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United States of America Patent

PATENT NO 7911608
APP PUB NO 20090302207A1
SERIAL NO

11664079

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Abstract

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A new method and strategy for the quantitative determination of enantiomeric purity that combines polarimetry, spectroscopy, and chemometric modeling. Spectral data is collected after a light beam is passed through a first polarimeter, a sample of a chiral compound, and a second polarimeter oriented at a 45 degree angle relative to the first polarimeter. The spectral data for samples of known enantiomeric composition is subjected to a type of multivariate regression modeling known as partial least squares (“PLS-1”) regression. The PLS-1 regression produces a mathematical model that can be used to predict the enantiomeric composition of a set of samples of unknown enantiomeric purity.

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Patent OwnerAddress
BAYLOR UNIVERSITY213 PAT NEFF HALL ONE BEAR PLACE BOX 97034 WACO TX 76798-7034

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Busch, Kenneth W Waco, US 15 272
Rabbe, Dennis H Crawford, US 6 44

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