Methods and apparatus for data analysis
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United States of America Patent
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Mar 8, 2011
Grant Date -
Apr 17, 2008
app pub date -
Sep 19, 2007
filing date -
Apr 2, 2004
priority date (Note) -
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Abstract
Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
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