Integrated circuit test work station
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United States of America Patent
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Mar 8, 2011
Grant Date -
N/A
app pub date -
Jun 17, 2005
filing date -
Jun 17, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test work station for testing ICs includes an output bench with sliding rails that partitions the table top of the output bench into segregated areas. ICs that pass testing are sorted according to an operating parameter, in other words binned, and placed in the appropriate segregated area. The sliding rails avoid mingling of the various categories (bins) of ICs. In a further embodiment, the test work station includes an input bench for receiving product. Failed ICs are kept on the input bench, thus segregating them from ICs that have passed testing and avoiding inadvertent mixing of bad ICs with good ICs. In a particular embodiment, the input and output benches are at a height that allows an operator to stand while working, and allows storage underneath the benches to keep the work areas clear.
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