Probe card with stacked substrate
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United States of America Patent
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Mar 1, 2011
Grant Date -
Oct 9, 2008
app pub date -
Feb 21, 2006
filing date -
Mar 1, 2005
priority date (Note) -
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Abstract
A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end to a contact of the second substrate.
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