Chuck for holding a device under test
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United States of America Patent
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Jan 25, 2011
Grant Date -
Jun 18, 2009
app pub date -
Feb 17, 2009
filing date -
May 23, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
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