Apparatus for the electromagnetic spectrum or optical analysis, in particular photometric, spectrophotometric or image analysis
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 11, 2011
Issued Date -
N/A
app pub date -
May 12, 2006
filing date -
Jul 15, 2005
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An apparatus for the electromagnetic spectrum or optical analysis of a material. The apparatus comprising a measuring probe having a housing with at least one radiation or light measuring element, a measuring window and with at least one detection element for the analysis. The measuring probe is formed and guided displaceably in the axial direction in such a way that at least part of the housing in which the measuring window is located enters through an opening in which the material to be analyzed is located for the analysis. The at least one measuring window is arranged in at least one subregion of the circumferential wall of the housing. A sealing cap is located between a front end face of the housing and the measuring window arranged in the circumferential wall and consequently covers the opening in a retracted position of the measuring probe.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully