Transfer mask for exposure and pattern exchanging method of the same

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United States of America Patent

PATENT NO 7862959
APP PUB NO 20050118516A1
SERIAL NO

11030963

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention is a transfer mask for exposure comprising a mask portion having a plurality of cells, each of which an opening of a predetermined pattern is formed in. When one side of the plurality of cells is exposed to a charged particle beam, each of the plurality of cells is adapted to make the charged particle beam pass through itself to the other side thereof based on the pattern of the opening formed in the cell. Thus, when a substrate to be processed is arranged on the other side of the cell, the pattern of the opening formed in the cell is transferred to the substrate to be processed and hence an exposure pattern is formed on the substrate to be processed. The feature of the present invention is that a part of or all the plurality of cells can be exchanged at the mask portion.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 107-6325
OCTEC INCTOKYO JAPAN

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nagaseki, Kazuya Nirasaki, JP 96 3054
Okumura, Katsuya Tokyo-To, JP 337 7835
Satoh, Naoyuki Nirasaki, JP 45 874

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