Probe tips for airborne instruments used to measure cloud microphysical parameters
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United States of America Patent
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Jan 4, 2011
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N/A
app pub date -
Mar 31, 2009
filing date -
Mar 31, 2009
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Abstract
An instrument for obtaining airborne measurements of cloud microphysical parameters. The instrument comprises supporting arms mounted thereon, optics and a detector for measuring the cloud microphysical parameters The supporting arms define an optical path of the instrument and comprise probe tips affixed thereto. The probe tips comprise an outer portion for deflecting particles away from the optical path of the instrument and an inner portion opposite the outer portion. The outer portion of the tips have a pyramidal section with a centre ridgeline and flat or concave surfaces effective to reduce water shedding and particle shattering during in-flight collection of data.
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