Method for testing and programming memory devices and system for same

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United States of America Patent

PATENT NO 7861059
SERIAL NO

11051325

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Abstract

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A method and system are provided for programming a plurality of memory devices arranged in parallel. In one embodiment of the present invention, the plurality of memory devices comprises first and second memory devices, and the method comprises providing successively the first address to the first memory device and the second address to the second memory device. The first address refers to a first group of storage locations in the first memory device and the second address refers to a second group of storage locations in the second memory device. The method then proceeds to load in parallel a string of data to the first and second memory devices so that the string of data is written simultaneously to the first group of storage locations in the first memory device and to the second group of storage locations in the second memory device.

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Patent Owner(s)

Patent OwnerAddress
NEXTEST SYSTEMS CORPORATION1901 MONTEREY HWY SAN JOSE CA 95112-6119

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Greene, Richard Mark Los Gatos, US 1 12
Holmes, John M Campbell, US 7 58
Kim, Young Cheol Saratoga, US 20 161
Magliocco, Paul Monte Sereno, US 4 108

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