Polarimetric Raman system and method for analysing a sample
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United States of America Patent
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Dec 28, 2010
Grant Date -
Dec 11, 2008
app pub date -
Jan 19, 2007
filing date -
Jan 20, 2006
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Expired
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Abstract
A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.
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