Detecting strain in birefringent materials using spectral polarimetry

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United States of America Patent

PATENT NO 7859653
APP PUB NO 20080094609A1
SERIAL NO

11848284

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Abstract

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A method, computer program product and system for analyzing multispectral images from a plurality of regions of birefringent material, such as a polymer film, using polarized light and a corresponding polar analyzer to identify differential strain in the birefringent material. For example, the birefringement material may be low-density polyethylene (LDPE), high-density polyethylene (HDPE), polypropylene, polyethylene terephthalate (PET), polyvinyl chloride (PVC), polyvinylidene chloride, polyester, nylon, or cellophane film. Optionally, the method includes generating a real-time quantitative strain map.

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Patent Owner(s)

Patent OwnerAddress
LYNNTECH INC2501 EARL RUDDER FREEWAY S COLLEGE STATION TX 77845

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cisar, Alan J Cypress, US 44 1304
Garner, Harold R Flower Mound, US 33 999
Huebschman, Michael L Frisco, US 2 91
Ragucci, Anthony J Bryan, US 8 163

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