Photosensitive polymer composition, method of forming relief patterns, and electronic equipment

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United States of America Patent

PATENT NO 7851128
SERIAL NO

11605262

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Abstract

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A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (--NH.sub.2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.

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Patent Owner(s)

Patent OwnerAddress
HITACHI CHEMICAL DUPONT MICROSYSTEMS LTDBUNKYO-KU TOKYO 112-0004

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nakano, Hajime Ibaraki, JP 35 1138
Nunomura, Masataka Ibaraki, JP 12 60
Ooe, Masayuki Ibaraki, JP 9 34
Tsumaru, Yoshiko Ibaraki, JP 5 20
Ueno, Takumi Ibaraki, JP 39 667

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