Integrated circuit chip having on-chip signal integrity and noise verification using frequency dependent RLC extraction and modeling techniques

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United States of America Patent

PATENT NO 7844435
SERIAL NO

11942270

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Abstract

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An integrated circuit chip has new Frequency dependent RLC extraction and modeling providing on chip integrity and noise verification and the extraction and modeling employs: A) 2D scan line algorithm for the collection of adjacent signal and power conductor coordinates; B) In core pair-wise frequency Dependent RL extraction; C) In core equivalent circuit synthesis; D) caching and partitioning RL extraction techniques for run time efficiency; and E) Techniques for synthesizing stable circuits to represent frequency dependent RL circuits for non-mono tonic R.sub.12.

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Patent Owner(s)

Patent OwnerAddress
GLOBALFOUNDRIES INCP O BOX 309 UGLAND HOUSE GRAND CAYMAN KY1-104

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bowen, Michael A Wallkill, US 33 267
Deutsch, Alina Chappaqua, US 22 657
Kopcsay, Gerard V Yorktown Heights, US 20 1917
Krauter, Byron L Leander, US 14 159
Rubin, Barry J Croton-on-Hudson, US 15 60
Smith, Howard H Beacon, US 23 159
Widiger, David J Austin, US 25 157

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