Defective block handling method for a multiple data channel flash memory storage device

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United States of America Patent

PATENT NO 7839684
SERIAL NO

12382204

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Abstract

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The block groups of a multiple data channel flash memory storage device are detected for defective blocks. The block group containing any defective blocks is divided into subgroups, each of which contains only defective blocks or only good blocks. The subgroups containing only good blocks are selected to establish a new block group having the same amount of blocks as that of the original block groups.

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Patent Owner(s)

Patent OwnerAddress
JIANGSU HUACUN ELECTRONIC TECHNOLOGY CO LTD226300 4TH FLOOR OF JIANGHAI ZHIHUI PARK NANTONG HIGH-TECH ZONE NANTONG CITY JIANGSU PROVINCE NANTONG CITY JIANGSU PROVINCE 226300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ji, Yung-Li Hsinchu, TW 9 141
Kao, Yu-Mao Hsinchu, TW 4 78
Shone, Fu-Ja Hsinchu, TW 9 117
Yen, Chih-Nan Hsinchu, TW 15 87

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