Method and device for fabricating nano-structure with patterned particle beam

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United States of America Patent

PATENT NO 7838851
SERIAL NO

11767816

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Abstract

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The present invention provides a method and an apparatus for producing a two-dimensional patterned beam, e.g. a two-dimensional patterned and focused ion beam, for fabricating a nano-structure on a substrate with the precursor gas. In comparison with the conventional focused ion beam that is applied for fabricating a dot-like nano-structure the method is more simplified and easy to be achieved.

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Patent Owner(s)

Patent OwnerAddress
INSTRUMENT TECHNOLOGY RESEARCH CENTER NATIONAL APPLIED RESEARCH LABORATORIESNO 20 R&D ROAD VI HSINCHU SCIENCE PARK HSIN-CHU CITY R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chao, Liang-Chiun Taipei, TW 6 32
Chen, Jyh-Shin Hsin-Chu, TW 39 813
Chen, Sheng-Yuan Hsin-Chu, TW 15 85
Chou, Hsiao-Yu Hsin-Chu, TW 10 54

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