Image forming method and charged particle beam apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7817105
APP PUB NO 20070159662A1
SERIAL NO

11713687

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawada, Hiroki Tsuchiura, JP 65 547
Kobaru, Atsushi Hitachinaka, JP 16 173
Morokuma, Hidetoshi Hitachinaka, JP 78 1025
Nakanishi, Kunio Kitaibaraki, JP 8 578
Sasada, Katsuhiro Hitachinaka, JP 28 200
Satou, Norio Ibaraki, JP 9 65
Takami, Sho Hitachinaka, JP 13 78
Yamamoto, Kouichi Hitachinaka, JP 44 683

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