High temperature range electrical circuit testing
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United States of America Patent
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Oct 19, 2010
Grant Date -
May 7, 2009
app pub date -
Oct 12, 2007
filing date -
Oct 12, 2007
priority date (Note) -
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Abstract
An electrical circuit testing assembly that includes a mechanical reference that is relatively stationary as compared to a circuit under test. A probe support assembly is coupled to the mechanical reference and includes probes for contacting interconnect pads on the circuit under test. Optionally, the probe support structure is attached to the mechanical reference via a column that is thermally resistive. Also optionally, a testing circuitry support structure (e.g., a printed circuit board) is not rigidly attached to the mechanical reference or to the probe support structure, thereby permitting the testing circuitry support structure to float with respect to the probe support structure.
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