Composition for photoresist stripping solution and process of photoresist stripping

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United States of America Patent

PATENT NO 7816312
APP PUB NO 20060205623A1
SERIAL NO

11371444

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Abstract

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The present invention provides a composition for photoresist stripping solution which shows a superior stripping property of photoresists and damaged photoresist layers remained after dry etching in the fabrication process of semiconductor circuit devices, without attacking new wiring materials and interlayer insulating film materials, as well as a process of stripping of photoresists and damaged photoresist layers. The composition for photoresist stripping solution which contains at least one of acetylene alcohol compounds and organic sulfonic acid compounds, and at least one of polyvalent alcohols and their derivatives is used.

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Patent Owner(s)

Patent OwnerAddress
KANTO KAGAKU KABUSHIKI KAISHA2-8 NIHONBASHIHONCHO 3-CHOME CHUO-KU TOKYO 1030023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ikegami, Kaoru Saitama, JP 4 35
Oowada, Takuo Tokyo, JP 8 127

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