Electron capture detector and nonradiative electron capture detector

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United States of America Patent

PATENT NO 7812614
APP PUB NO 20070296417A1
SERIAL NO

11664257

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Abstract

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It is intended to realize measuring of trace organic components and to render qualitative procedure efficient through imparting of selectivity. Penning gas and dopant gas are ionized in a space isolated from discharge part with the use of metastable helium obtained by direct-current glow discharge, and with the use of thus obtained plasma, the efficiency of ionization of components to be measured is enhanced, so that intensified ion current can be obtained. Further, through selection of dopant gas and Penning gas, selectivity can be imparted. Thus, not only can measuring of trace organic components be performed but also selectivity can be imparted.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH SCIENCE SYSTEMS CORPORATION1040 OAZA ICHIGE HITACHINAKA-SHI IBARAKI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawamura, Norio Hitachinaka, JP 22 431
Kurita, Shinji Hitachiota, JP 1 5
Takeuchi, Masahiro Tokyo, JP 96 989

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