X-ray source and fluorescent X-ray analyzing apparatus
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United States of America Patent
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Oct 5, 2010
Grant Date -
Apr 10, 2008
app pub date -
Oct 5, 2007
filing date -
Feb 1, 2006
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Expired
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Abstract
The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target is arranged in superposition on a primary target. An electron beam generated by an electron gun enters the primary target, which passes and emits a continuous X-ray. The secondary target transmits and emits a characteristic X-ray excited by the continuous X-ray emitted from the primary target. The primary target and the secondary target are superposed one on the other, so that the continuous X-ray emitted from the primary target efficiently excites the secondary target thereby to efficiently generate the characteristic X-ray.
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