Contact device to contact an electrical test specimen to be tested and a corresponding contact process
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United States of America Patent
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Sep 14, 2010
Grant Date -
Jun 26, 2008
app pub date -
Nov 27, 2007
filing date -
Nov 27, 2006
priority date (Note) -
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Abstract
The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.
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