Method of fabricating metal interconnects and inter-metal dielectric layer thereof

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United States of America Patent

PATENT NO 7795131
SERIAL NO

11684646

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Abstract

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A method of fabricating metal interconnects and an inter-metal dielectric layer thereof. A first metal interconnect pattern and a second metal interconnect pattern disposed thereon are formed on a substrate by plating processes. Subsequently, an inter-metal dielectric layer is formed on the substrate, the first metal interconnect pattern and the second metal interconnect pattern. The inter-metal dielectric layer is then planarized and the second metal interconnect pattern is exposed.

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Patent Owner(s)

Patent OwnerAddress
TOUCH MICRO-SYSTEM TECHNOLOGY INC566 KAO-SHI RD YANG-MEI TAOYUAN HSIEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Jie-Mei Taipei County, TW 1 3
Huang, Kuan-Jui Kao-Hsiung Hsien, TW 14 60
Wang, Chung-Hsiang Taoyuan County, TW 6 43

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