Reflective display device testing system, apparatus, and method

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United States of America Patent

PATENT NO 7791717
SERIAL NO

11753577

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Abstract

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A system for testing a reflective display device includes a testing apparatus and a computer. The testing apparatus includes one or more light emitters, one or more light detectors, an analog-to-digital converter (ADC) module, and a microcontroller unit (MCU). The light emitters are for projecting light onto a reflective display device located on the testing apparatus. The light detectors are for sensing reflected light from the reflective display device, and generating electricity according to a luminance of the reflected light. The ADC module is for receiving the electrical signals from the light detectors, and producing a digital output according to voltages of the electrical signals. The MCU is configured for reading the digital output of the ADC module. The computer is for processing the digital output and displaying results after processing.

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Patent Owner(s)

Patent OwnerAddress
ENSKY TECHNOLOGY (SHENZHEN) CO LTD1-3/F BLOCK 2 INBOW BUILDING TENTH INDUSTRY AREA LONGHUA STREET BAOAN DISTRICT SHENZHEN CITY GUANGDONG PROVINCE
ENSKY TECHNOLOGY CO LTD11 F NO 69 SEC 1 CHUNG SHAN RD PAN CHIAO CITY TAIPEI HSIEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cao, Qing-Shan Shenzhen, CN 15 126
Fa, Wen-Bo Shenzhen, CN 1 23
Mu, Xu-Chen Shenzhen, CN 3 27
Zhou, Jiang-Yong Shenzhen, CN 2 35

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