Direct ICP emission spectral analysis method of solid sample
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United States of America Patent
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Aug 24, 2010
Grant Date -
Aug 21, 2008
app pub date -
Feb 12, 2008
filing date -
Feb 16, 2007
priority date (Note) -
Expired
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Abstract
An ICP analysis method for solid samples which can secure reliability of the analytical results. The present invention provides an analytical method in which a finely powdered solid sample is directly injected into an inductively coupled plasma-aided emission spectrometer, wherein standard liquid samples of known concentration of objective element are analyzed by the spectrometer to establish a calibration curve for the element; at least one standard sample of finely powdered solid of known concentration is analyzed by the spectrometer to determine a conversion factor by a given procedure; and the result of the finely powdered solid sample is corrected using the conversion factor.
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